Helios NanoLab 450S – FEI

 

Applications of FIB-SEM: 

    • Using the FIB, cut the sample, then use the SEM to locate and image any defect
    • Cut a thin slice (30-50 nm), then lift it out, then image it using TEM/STEM with EDS/EELS to measure the chemistry

 

 

The Helios NanoLab 450S is ideally suited for high throughput, high-resolution S/TEM sample preparation, imaging and analysis.

Its exclusive FlipStage and in-situ STEM detector can flip from sample preparation to STEM imaging in seconds without breaking vacuum or exposing the sample to the environment.

 

 

News

Announced: August 25, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
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Announced: July 8, 2014
New XPS System with Argon Ion Clusters for Chemical State Depth Profiling
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