JEM 3010 – JEOL

 

Application:  Atomic scale imaging of defects, thin films

 

 

JEM-3010 ultrahigh resolution analytical electron microscope with a point to point and lattice resolution of 0.17 nm and 0.10 nm, respectively.

Among its more outstanding features are a microactive goniometer with motorised axes and computer controlled data management and storage.

 

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