Magellan XHR 400L FE-SEM – FEI

 

Applications of SEM:

    • Image features of interest
    • Check dimensions of features
    • Look for nano-scale defects

 

 

The world’s first extreme high-resolution (XHR) SEM, the FEI Magellan™ 400L system delivers unmatched surface-sensitive imaging performance at sub-nanometer resolution, without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM.

 

 

 

News

Announced: July 26, 2017
Boosts Instrument Capacity to Become World's Largest Independent Microscopy Lab
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Announced: August 25, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
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