Depth of Information

 

Depth of Information is a key factor in getting the elemental and chemical state information needed to help you to solve the problem or collect the R&D data needed to move to the next step.

The most useful instrument or analytical tool to analyze a material, a wafer or a product depends directly on the depth of the information needed and the size of the beam being used.  The Wall Charts below help us to select the analytical tool that is best suited to our current needs.

 

EDS versus XPS – Depth of Useful Information
(elemental composition and atom%)

 

 

 

Surface Analysis Areas & Depths of Information

 

 
 

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News

Announced: August 25, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
Read News Release


Announced: July 8, 2014
New XPS System with Argon Ion Clusters for Chemical State Depth Profiling
Read News Release


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