Glossary of Terms

 

A Guide to the Alphabet Soup of Analytical Instruments

  • AES - Auger Electron Spectroscopy
  • AFM - Atomic Force Microscopy
  • AEM - Analytic Transmission Electron Microscopy
  • C-SAM - C-Mode Scanning Acoustic Microscopy
  • C-SOM - Confocal Scanning Optical Microspocy
  • CE-FIB - Circuit Edit-Focused Ion Beam
  • D-SIMS - Dynamic-Secondary Ion Mass Spectrometry
  • E-SEM - Environmental-Scanning Electron Microscopy
  • EDS - Energy-Dispersive (X-Ray) Spectrometry (aka EDX)
  • EELS - Electron Energy Loss Spectrometer
  • ESCA - Electron Spectroscopy for Chemical Analysis (aka XPS)
  • FE-SEM - Field Emission - Scanning Electron Microscopy
  • FE-TEM - Field Emission - Transmission Electron Microscopy
  • FIB - Focused Ion Beam
  • FIB-SEM - Focused Ion Beam-Scanning Electron Microscopy
  • FMI - Flourescent Micro-Thermal Imaging
  • FT-IR - Fourier Transform Infra-Red Spectroscopy
  • GD-MS - Glow Discharge-Mass Spectrometry
  • GD-OES - Glow Discharge-Optical Emission Spectrometry
  • ICP-MS - Inductively Coupled Plasma-Mass Spectometry
  • ICP-OES - Inductively Coupled Plasma-Optical Emission Spectometry
  • P-FIB - Plasma-Focused Ion Beam
  • RAMAN - Raman Spectroscopy
  • SEM - Scanning Electron Microscopy
  • SIMS - Secondary Ion Mass Spectrometry
  • STEM - Scanning Transmission Electron Microscopy
  • TDR - Time Domain Refectometry
  • TEM - Transmission Electron Microscopy
  • TOF-SIMS - Time-of-Flight - Secondary Ion Mass Spectromentry
  • TXRF - Total Reflection X-Ray Flourescence
  • VASE - Variable Angle Spectroscopic Ellopsometry
  • WD-XRF - Wavelength Dispersive X-Ray Flourescence
  • URH - Ultra High Resolution
  • XPS - X-Ray Photoelectron Spectrometry (aka ESCA)
  • XRD - X-Ray Diffraction
  • XRR - X-Ray Relectometry

Download:   Glossary of Terms – Acronyms  (PDF)


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