JEM 2010F – JEOL


Application:  Measure atomic-scale features and defects, film thicknesses



The JEOL 2010F TEM provides both conventional and high resolution TEM imaging using a Field Emission tip. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments.

The analytical objective lens pole piece on this microscope allows for sample tilting up to 30 degrees, yet maintains a point-to-point resolution of 0.25 nm.


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