Parallel Lapping

 

Greatly Improves SEM and Optical Imaging of Cross-Sections

Optical Imaging of Cross-section - Parallel Lapping - Nanolab Technologies 

 

Used for die or packages to expose and inspect electronic devices layer by layer.  Typically used as a follow up to a defect localization by another technique, such as Photon Emission Microscopy (EMMI)/Laser Stimulation.

Parallel Lapping - Nanolab Technologies 

 

The grinding and polishing steps in a metallographic preparation method can be accomplished in many ways and combinations.  Most steps are performed on a table-top unit that can be used for both grinding and polishing.  There are also systems that are strictly for grinding.

The goal of any method is to prepare a final polished specimen free of deformation and suitable for analysis.  The initial abrasive size should be as small as possible, yet be able to create a flat surface and remove any sectioning deformation.

Each subsequent step should induce as little deformation as possible while removing any damage from the previous step.  Using adequate lubrication, most commonly water, throughout the process will aid in minimizing deformation.

 

–> Service Request Forms

–> Contact Us

 

Did You Know?

The use of specimen holders produces superior surface flatness and edge retention compared to manual preparation.  Automated systems enable better control of variables such as the pressure applied to the specimen, the speed and relative direction of the work surface, and the application of abrasive.  All of these impact the quality of the final results and overall length of preparation time.

Tips, Tricks & Techniques

To ensure specimens are loaded plane to one another, always use a loading plate.  This simple step can save significant grinding time.

Photon Emission Microscopy (EMMI)/Laser Stimulation 

 

Features and Benefits

  • Unique bowl shape for easy access to 10in [254mm] or 12in [305mm] platens
  • Pro version integrates seamlessly with Burst Dispensing System
  • Bright, energy-efficient LED lighting and quick release lift lock chuck allows easy specimen holder changes
  • Multipurpose water nozzle provides critical cooling and lubrication during preparation and stowable hose enables quick cleanup
  • High torque continuous-duty motor provides constant platen speed and torque through a whisper quiet belt drive
  • Variable speed, reversible power head provides both single and central force operation with a head locking handle to secure the head, while the head location stop lever locates the specimen holder in the exact location each time
  • Platen cooling to help minimize platen heat build-up and reduce sample deformation in heavy-duty use
  • Membrane or touch screen controls
  • Manual use or upgrade with AutoMet® 250/300 Power Head for semi-automatic use
  • Durable construction, well lit, ergonomic platen removal
  • Retractable water hose for washdown
  • Pro version offers programmability, Z-axis removal and full integration with Burst Dispensing System
  • Membrane version compatible with Burst Dispensing System and Stadium Seating in manual and semi-automatic modes

News

Announced: August 25, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
Read News Release


Announced: July 8, 2014
New XPS System with Argon Ion Clusters for Chemical State Depth Profiling
Read News Release


 Sample Submission for Analytical Services at Nanolab Technologies

 Request Quotes for Analytical Services from Nanolab Technologies
 Request for Free Pickup for South Bay Area Customers
Nanolab's Visual Guides for Selecting Tools for Checmical Analysis - Available for Download

 Nanolab Technologies is ISO Certified Analytical Service Provider in Milpitas, CA