Sample Preparation

 

Application:  
Prepare samples for SEM, STEM, FIB-SEM and optical inspection

Sample preparation is critical to the samples being imaged by TEM and SEM, and the overall aim of the imaging study.  The instruments used for sample preparation at Nanolab are state-of-the-art tools.

 




Ion Polishing

 



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Tools Used to Prepare Samples for Imaging

 



 



 



 

 

News

Announced: August 25, 2015
Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
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Announced: July 8, 2014
New XPS System with Argon Ion Clusters for Chemical State Depth Profiling
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 Nanolab Technologies is ISO Certified Analytical Service Provider in Milpitas, CA