Sample Preparation

 

Application:  
Prepare samples for SEM, STEM, FIB-SEM and optical inspection

Sample preparation is critical to the samples being imaged by TEM and SEM, and the overall aim of the imaging study.  The instruments used for sample preparation at Nanolab are state-of-the-art tools.

 




Ion Polishing

 



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Tools Used to Prepare Samples for Imaging