Service Literature

Analytical Tools:  List of Analytical Services at Nanolab  (PDF)

Beam Sizes:   Beam Sizes of Chemical Analysis Tools  (PDF)

Circuit-Edit FIB:   5 nm Circuit Modification – Proof of Concept  (PDF)

Client-Analyst Discussion:   Sample Info to Improve Analysiss  (PDF)

Contamination Caused by Gloves:   Glove Contamination  (PDF)

FIB-SEM-EDS:   0.8 nm Imaging with Elemental Analysis  (PDF)

Non-Destructive Imaging:   Real-Time Non-Destructive Imaging  (PDF)

Package Deprocessing:   Physical & Electrical FA Solution  (PDF)

Package Decapsulation:   De-Cap & Die Removal Solution  (PDF)

SIMS:   Secondary Ion Mass Spectrometry  (PDF)

SOM 4000 (EMMI):   Electrical Fault Isolation Solution  (PDF)

STEM/EELS:   Atomic Scale Imaging & Nanometer Scale Chemistry  (PDF)

TEM/EDS:   Atomic Scale Imaging & Nanometer Scale Chemistry  (PDF)

Time-Domain Reflectometry:   Non-Destructive Electrical Analysis  (PDF)

Tool-Set:  Nano-Tools to Measure/Analyze Your Materials  (PDF)

UHR-SEM-EDS:  1.4 nm Imaging and Elemental Analysis  (PDF)

X-ray Imaging:   Real-Time Non-Destructive Imaging  (PDF)

XPS (ESCA):   Surface Chemical Analysis by XPS   (PDF)

 

Collection of All 12 Flyers:  Binder- 12 Flyers – June 2012  (PDF)

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