PUBLICATION

Service Literature

Technique & Application Flyers (1-2 pages)

Analytical Tools:  List of Analytical Services at Nanolab  (PDF)

Beam Sizes:   Beam Sizes of Chemical Analysis Tools  (PDF)

Circuit-Edit FIB:   5 nm Circuit Modification – Proof of Concept (PDF)

Client-Analyst Discussion:   Sample Info to Improve Analysiss  (PDF)

Contamination Caused by Gloves:   Glove Contamination (PDF)

FIB-SEM-EDS:   0.8 nm Imaging with Elemental Analysis (PDF)

Non-Destructive Imaging:   Real-Time Non-Destructive Imaging (PDF)

Package Deprocessing:   Physical & Electrical FA Solution (PDF)

Package Decapsulation:   De-Cap & Die Removal Solution (PDF)

SIMS:   Secondary Ion Mass Spectrometry  (PDF)

SOM 4000 (EMMI):   Electrical Fault Isolation Solution  (PDF)

STEM/EELS:   Atomic Scale Imaging & Nanometer Scale Chemistry (PDF)

TEM/EDS:   Atomic Scale Imaging & Nanometer Scale Chemistry (PDF)

Time-Domain Reflectometry:   Non-Destructive Electrical Analysis (PDF)

Tool-Set:  Nano-Tools to Measure/Analyze Your Materials (PDF)

UHR-SEM-EDS:  1.4 nm Imaging and Elemental Analysis  (PDF)

X-ray Imaging:   Real-Time Non-Destructive Imaging (PDF)

XPS (ESCA):   Surface Chemical Analysis by XPS   (PDF)