Depth of Information is a key factor in getting the elemental and chemical state information needed to help you to solve the problem or collect the R&D data needed to move to the next step.
The most useful instrument or analytical tool to analyze a material, a wafer or a product depends directly on the depth of the information needed and the size of the beam being used. The Wall Charts below help us to select the analytical tool that is best suited to our current needs.
EDS versus XPS – Depth of Useful Information
(elemental composition and atom%)
Surface Analysis Areas & Depths of Information