Characterizes the near surface (0.5-3.0 µ) elemental composition at any point or over any area of interest
EDS vs XPS – Depth of Information
GLOBAL USES
- Quality Control
- Problem Solving
- Failure Analysis
- Production Control
- Materials Development
- Reverse Engineering
APPLICATIONS
- Particle analysis
- Contamination
- Thickness of films
- Delamination (peeling)
- Complete unknown
- Good versus Bad
- A versus B
- Element composition
- Multi-point QC
- Powders, Fibers
EDS (EDX) Analysis provides elemental analysis of a sample inside a SEM, TEM or FIB. Our new AZtec from Oxford is a new and revolutionary materials characterisation system that gathers accurate data at the micro- and nanoscales.
Launched in 2011, AZtec-Energy combines the latest generation of detector hardware, multi-tasking software, decades of EDS know-how and feedback from the world’s largest user community to create a platform that pushes back the boundaries of EDS analysis.
X-MaxN Benefits
- Productive count rates at low beam currents
- Maximising EDS imaging performance and accuracy
- No need to change imaging conditions for X-ray analysis
- Significantly higher count rates at the same beam current
- Shorter acquisition times
- Better statistical confidence
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