Magnifications of up to 600,000x are possible with resolution on the order of nanometers. Global uses of FE-SEM include quality control, problem solving, failure analysis, production control, materials development, and reverse engineering.
The ultra high resolution SEM and BackScattered Electron (BSE) images can be exported as TIFF, BMP, or JPEG data files.
If you need specialty work, please give us a call.
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