Application:
Image the surface topology of any solid material with very high spatial resolution
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FE-SEM (SEM)
Application:
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GLOBAL USES
APPLICATIONS
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Instrument Specifications
Image Performance Results using Gold Crystals
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A SEM is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface typography, composition, and other properties such as electrical conductivity.
Strengths and Advantages of FE-SEM/E-SEM:
- 0.8 nm at 30 kV
- 1.4 nm at 1 kV
- Beam landing energy: 50 V- 30 kV
- In-lens SE and BSE detectors
- EDS for elemental analysis
Routine Imaging and Analyses:
- Complete unknown – chemistry and thickness
- Particles, defects, fibers, and nano-contamination
- Elemental composition by EDS
- Low vacuum, low voltage
- Insulators, semiconductors or conductors
Advanced Imaging and Analyses:
- Surface uniformity of elements
- Quality control
- Viscous liquids, greases, fibers, and nano-particle
Nano-Wires (ZrO2)
Element Map using EDS
Medicine Tablet
Survey Scan For Elements using EDS
