Instrument Specifications

Image Performance Results using Gold Crystals

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A SEM is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface typography, composition, and other properties such as electrical conductivity.

• 0.8 nm at 30 kV
• 1.4 nm at 1 kV
• Beam landing energy: 50 V- 30 kV
• In-lens SE and BSE detectors
• EDS for elemental analysis

Routine Imaging and Analyses:

• Complete unknown – chemistry and thickness
• Particles, defects, fibers, and nano-contamination
• Elemental composition by EDS
• Low vacuum, low voltage
• Insulators, semiconductors or conductors

Advanced Imaging and Analyses:

• Surface uniformity of elements
• Quality control
• Viscous liquids, greases, fibers, and nano-particle

Nano-Wires (ZrO2)

 
Element Map using EDS

 

 Medicine Tablet  

 
  Survey Scan For Elements using EDS