Publications by Nanolab Members
XPS Applications in Scientific Journals
- Comparison of the Effects of Downstream H2- and O2-based Plasma on Removal of Photoresist, Silicon, and Silicon nitrides, by Bayu Thedjoisworo and David Cheung (Lam Research) and Vince Crist (Nanolab Technologies)
Citation: J of Vacuum Science & Technology B (Vol.31, Issue 2), 2013 View online: https://link.aip.org/link/?JVB/31/02120
- XPS of Ar in Graphite by B. Vincent Crist (XPS International)
Citation: Surf. Sci. Spectra 1, 376 (1992)
View online: https://dx.doi.org/10.1116/1.1247636
- XPS of KBr – Cleaved in Air by B. Vincent Crist (XPS International)
Citation: Surf. Sci. Spectra 1, 292 (1992)
View online: https://dx.doi.org/10.1116/1.1247654
XPS Information in Web-Sites
- Review of XPS Data-Banks in 2007 by B. Vincent Crist
- XPS Software, Books & Databases: www.xpsdata.com