State-of-the-Art Instruments
Tools that Characterize Chemistry or Structure
Our Commitment to You
Nanolab is committed to your needs and shows that commitment by the un-ending, yearly acquisition of state-of-the-art instrumentation for:
Nanolab Technologies offers cutting edge technology and expertise for Failure Analysis, Analytical Microscopy, Surface Analysis and FIB circuit edit. An experienced team of engineers and scientists using state-of-the-art equipment equals guaranteed accuracy and results.
Nanolab is very pleased to offer both the expertise and technology to provide
solutions and answers to the ever increasing challenges that our customers experience with today’s shrinking geometries.
Instruments
STEM | FT-IR | AR-XPS | HAADF | XRR | EELS |
FIB-SEM | 2D X-ray | Circuit-Edit | C-SAM | SOM | LA ICP-MS |
XPS | EF-TEM | XRD | SIMS | TEM | 300mm |
UHR-SEM | 3D X-ray | Raman | EDS | More… |
The chart below may help you to select an initial analysis service.
Please contact sales for a copy to mount on your wall.
Click on Image to Expand