JEM 2010F – JEOL


Application:  Measure atomic-scale features and defects, film thicknesses



The JEOL 2010F TEM provides both conventional and high resolution TEM imaging using a Field Emission tip. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments.

The analytical objective lens pole piece on this microscope allows for sample tilting up to 30 degrees, yet maintains a point-to-point resolution of 0.25 nm.


–> Service Request Forms

–> Contact Us


To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.