Nanolab supplies managed services to simplify the work
Using our Managed Services you can do one-stop work for all your analytical needs at the same cost as if you went direct to our sister organizations. Nanolab does the extra footwork, you save time and enjoy the convenience.
Let us help you collect all the data you need from a set of samples, wafers or products that need analysis. The links to the technique abbreviations (acronyms) connect to pages on Wikipedia. At the bottom of this page there are a collection of example spectra, images, depth profiles and plots.
- Atomic Force Microscopy (AFM)
- Auger Electron Spectroscopy (AES)
- Fourier Transform – Infrared Spectroscopy (FT-IR & IR)
- Gas Chromatography – Mass Spectrometry (GC-MS)
- Glow Discharge – Optical Emission Spectrometry (GD-OES)
- Inductively Coupled Plasma – Optical Emission Spectrometry (ICP-OES)
- Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
- Laser Ablated ICP-MS (LA-ICP-MS)
- Raman Spectroscopy (Raman)
- X-ray Diffraction (XRD)
- X-ray Reflectometry (XRR)
- Wavelength Dispersive – X-ray Fluoresence (WD-XRF) WDX
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Examples of Images, Spectra, Depth Profiles and Plots
from Managed Services
AFM Image of Soda-Lime Glass
D-SIMS Dopant Profile of P in Si
IR Spectra of SiOF and SOG
GC-MS Mass Spectrum of Nonoxynol-9
GD-OES Depth Profile of TiN on Tool Steel
ICP-OES Spectrum
Laser Ablated Material
Laser Ablated ICP-MS Depth Profile
RAMAN Spectra of Graphene
RAMAN Spectra of Calcite
RAMAN Spectrum of Polystyrene
XRD Spectrum of 5 Graphene Films
XRR Plot of Graphene Film
WD-XRF (WDX) vs EDS of Tool Steel
