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Nano-Notes

Application Notes that describe how analytical tools can be used to analyze materials and help you to solve problems.

XPS (ESCA) Application Notes

XPS – Glove Study #1 by XPS  (PDF)
XPS – Table of XPS BEs and Scofield RSFs  (PDF)
XPS – A Charge Referencing Problem (PDF)
XPS – Teach Yourself  (PDF)
XPS – Fundamentals in Schematics – 11×17″ (PDF)
XPS – Reference BEs & Atom% Results – Poster (PDF)
XPS – C 1s BEs of Hydrocarbons on Native Oxides vs Metals
XPS – Periodic Table of NIST pure element BEs & Stats (PDF)
XPS – Adhesion Problem with 3 Wafer Protection Films (PDF)
XPS – Imrpoved Charge Control for XPS of Insulators (PDF)

XPS – Information Depth – 3 Lambda (PDF)

Sample Preparation & Submission Info

Sample Preparation for TEM, SEM & XPS (PDF)

Sample Submission Guidelines

Technique Comparison Notes

Beam Sizes and Depth of Info of Techniques 11×17″ (PDF)

EDX Tear-Drop, Auger and XPS Information Depths (PDF)

Technique Selection Guides

Routine Problems – Analysis Needs vs Analysis Tools Applied

Semiconductor Drawings

Schematic of MosFet Design (PDF)

Nano-Notes

XPS (ESCA) Application Notes

Sample Preparation & Submission Info

Technique Comparison Notes

Technique Selection Guides

Semiconductor Drawings

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