Nanolab Technologies provides a wide variety of technical services publications that guide users towards the selection of the best service for particular needs.
- Client-Analyst Discussion: Sample History Improves Analysis (PDF)
- Sample Submission Guidelines: Sample Submission Guidelines
- Nanolab’s Tool-Set: Nano-Tools Measure/Analyze Your Materials (PDF)
- Analytical Tools List: List of Analytical Services at Nanolab (PDF)
- X-ray Imaging: Real-Time Non-Destructive Imaging (PDF)
- XPS (ESCA): Surface Chemical Analysis by XPS (PDF)
- TEM/EDS: Atomic Scale Imaging & Nanometer Scale Chemistry (PDF)
- STEM/EELS: Atomic Scale Imaging & Nano Scale Chemistry (PDF)
- FIB-SEM-EDS: 0.8 nm Imaging with Elemental Analysis (PDF)
- UHR-SEM-EDS: 1.4 nm Imaging and Elemental Analysis (PDF)
- Circuit Edit FIB: 5 nm Circuit Modification – Proof of Concept (PDF)
- SOM 4000 (EMMI): Electrical Fault Isolation Solution (PDF)
- Package Deprocessing: Physical & Electrical FA Solution (PDF)
- Package Decapsulation: De-Cap & Die Removal Solution (PDF)
- Time-Domain Reflectometry: Non-Destructive Electrical Analysis (PDF)
- Collection of All 12 Flyers: Binder – 12 Flyers – June 15 2012 (PDF)
- Contamination Caused by Gloves: Glove Contamination (PDF)
- Analysis Beam Sizes: Beam Sizes of Chemical Analysis Tools (PDF)
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