Sample Preparation


Prepare samples for SEM, STEM, FIB-SEM and optical inspection

Sample preparation is critical to the samples being imaged by TEM and SEM, and the overall aim of the imaging study.  The instruments used for sample preparation at Nanolab are state-of-the-art tools.


Ion Polishing


–> Service Request Forms

–> Contact Us

Tools Used to Prepare Samples for Imaging






To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.