Services Overview

 

Our Unique Approach to Testing and Analytical Services

Nanolab Technologies has earned a trusted place with clients in a wide variety of industries, including:  semiconductor, solar, PV, bio-medical, laser, polymer…. 

Larger testing laboratories may promise superior reach and global service, but we find that clients really prize the ongoing relationship with our scientists, engineers and technicians, and our continuing commitment to acquiring the latest equipment.

We’re responsive. We meet our deadlines. And, we are very careful to match the exact right analytical approach to the problem at hand.

Whether you need us to perform:  Surface Chemical Analysis,  Advanced Microscopy,  Defect Analysis,  Circuit Edit,  Construction AnalysisFault Isolation,  Materials Characterization, or  Process Characterization, you will receive best-in-class analysis and testing at every turn.

Free Courier Service to Pickup & Return Samples
within South Bay area around Milpitas, California (see map)



Free Courier Service to Pickup & Return Samples - Nanolab Technologies

ANALYTICAL SERVICES

MICROSCOPY & IMAGING 

  • 2-D X-ray Imaging – Real Time (RTX)
  • 3-D X-ray Tomography
  • Field Emission – Scanning Electron Microscopy (FE-SEM)
  • Focused Ion Beam – Scanning Electron Microscopy (FIB-SEM)
  • High Resolution Optical Microscopy
  • Laser Confocal Microscopy
  • Scanning Transmission Electron Microscopy (STEM)
  • Transmission Electron Microscopy (TEM)
  • Ultra High Resolution SEM (UHR-SEM)

MATERIALS CHARACTERIZATION – CHEMICAL & PHYSICAL

  • 2-D X-ray Imaging
  • 3-D X-ray Tomography
  • Analytical Transmission Electron Microscopy (AEM)
  • Electron Energy Loss Spectrometry (EELS)
  • Energy Dispersive Spectroscopy (EDS, EDX)
  • Field Emission – Scanning Electron Microscopy (FE-SEM)
  • Focused Ion Beam – Scanning Electron Microscopy (FIB-SEM)
  • High Resolution Digital Optical Microscopy (STEM)
  • Secondary Ion Mass Spectroscopy (SIMS)
  • Ultra High Resolution Sem (UHR-SEM)
  • X-Ray Photoelectron Spectroscopy (XPS)

ELECTRICAL FAILURE ANALYSIS (E-FA)

  • Analytical Probe Station
  • Curve-Trace – Manual & Automated
  • Emission Microscopy – Near Infrared (EMMI)
  • Flourescent Micro-Thermal Imaging with Lock-In (FMI)
  • Laser Stimulation Microscopy – Near Infrared
  • Scanning Optical Microscope (SOM) – Backside
  • Time Domain Reflectometry (TDR)

PHYSICAL FAILURE ANALYSIS (P-FA)

  • 3-D X-ray Tomography
  • C-Scanning Acoustic Microscopy (C-SAM)
  • De-Capsulation
  • Deprocessing
  • FIB-SEM Cross Selection
  • Field Emission – Scanning Electron Microscopy (FE-SEM)
  • Mechanical Cross-Sectioning
  • Parallel Lapping
  • Real Time 2-D X-ray Imaging (RTX)
  • Scanning Acoustic Tomography (SAT)
  • Wet Chemistry – Strong Acids, Bases, Oxidizers

BUNDLED SERVICES for FAILURE ANALYSIS

  • LEVEL I
    • Non-Destructive, Curve Trace, Failure Verification, External Inspection, Internal Optical Inspection, C-Scanning Acoustic, Microscopy, 2-D Real Time X-ray, De-Cap, TDR
  • LEVEL II
    • LEVEL I Plus – Fault Isolation, Advanced Electrical Testing – Non-Destructive
  • LEVEL III
    • LEVEL I & II Plus – Deprocessing, Cross Sectioning, Advanced Microscopy, Materials Characterization, 3-D X-ray Tomography

SAMPLE PREPARATION Per Request

  • Argon Ion Milling
  • De-Capsulation (De-Cap)
  • Diamond Milling – Backside / Frontside Sample Prep
  • Dimpling
  • Focused Ion Beam – Circuit Edit (FIB – Circuit Edit)
  • Plasma Cleaning
  • Preparation for TEM / STEM / FIB-SEM
  • Reactive Ion Etching (RIE)

CIRCUIT EDIT

  • Single Beam FIB (Back-Side and Top-Side)
  • Single Beam FIB (Plasma Beam)
  • Single Beam FIB (with Gases)

MANAGED SERVICES – NANOLAB PARTNERS

  • Atomic Force Microscopy (AFM)
  • Auger Electron Spectroscopy (AES)
  • Fourier Transform – Infrared Spectrometry (FT-IR)
  • Gas Chromatography – Mass Spectrometry (GC-MS)
  • Glow-Discharge – Optical Emission Spectrometry (GD-OES)
  • Inductively Coupled Plasma – Optical Emission Spectrometry (ICP-OES)
  • Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
  • Laser Ablation – Inductively Coupled Plasma – Mass Spectrometry (LA-ICP-MS)
  • Laser De-Capping
  • Raman Spectroscopy
  • X-ray Diffraction (XRD)
  • X-ray Reflectometry (XRR)
  • Wavelength Dispersive – X-ray Flourescence (WD-XRF)

–> Service Request Forms

–> Contact Us

To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.