SOM 4000 – Semicaps

 

Applications of SOM

    • Frontside & Backside photon emission for leakage & junction damage
    • Frontside & Backside laser stimulation for hot spots & carrier activity
    • High resolution confocal microscopy for die cracks, chip out or other anomalies

SOM 4000 – Semicaps - Nanolab Technologies 

 

Global uses of SOM 4000 include failure analysis, yield enhancement, ESD/latch-up failures, problem solving, design debug, and qualification failures.

Strengths and Advantages of SOM 4000:

    • 300 mm wafer analysis
    • InGaAs detector
    • High resolution confocal laser microscopy
    • Thermal and Carrier laser stimulation
    • Analytical probing
    • Low cost setup for backside analysis

Advanced Analyses:

    • Pulsed laser analysis without lock-in
    • Tester docked analysis with Soft Defect Localization (SDL)

Applications of SOM - Nanolab Technologies 



 

SOM 4000 – Semicaps 



 

SOM 4000 – Semicaps -- by Nanolab Technologies 
Photon Emission
(using InGaAs detector)



 

Photon Emission (using InGaAs detector) - Nanolab Technologies 

 

To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.