Techniques

Nanolab Technologies offers cutting edge technology and expertise for Failure Analysis, Analytical Microscopy, Surface Analysis and FIB Circuit Edit services in a wide range of industries such as Semiconductor, MEMS, Materials Science, Electronics, LED, Solar, Photovoltaic, Nanotechnology, Medical Devices, Defense, and Advanced Packaging.

As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers over 40 years experience in materials testing services.  With 2,500 instruments worldwide we can scale to your demand, meet time constraints and ensure client confidentiality.

Featured Techniques

APT

3D spatial imaging and chemical composition

FIB analysis at cryogenic temperatures.

TEM analysis at cryogenic temperatures.

Combining a SEM and FIB

EDS

Analysis using EDS

Analysis using EELS

SEM

Analysis using SEM

Analysis using TEM or STEM

Technical Webinars

Learn how APT can obtain chemical distributions across grain boundaries, heterojunctions, and thin films.

Learn how analysis of Li-ion batteries materials are critical to understand their performance

Learn about FIB-SEM methods for cross-section imaging failure analysis and TEM sample preparation.

As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:

40+

Years of Experience

+2,500

State-of-the-Art Instruments

+4,000

Clients Worldwide

+20

Global Locations

Ask an Expert

Please submit your advanced microscopy inquiry online, and we’ll route it to the right technical expert. We reply to most online inquiries within two hours if received between 6 AM and 5 PM Pacific Standard Time.

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