Scanning Electron Microscope

Eurofins Nanolab Technologies offers its customers Scanning Electron Microscope (SEM) services.  Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.

A Scanning Electron Microscope (SEM) is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern. 

The technique uses an e-beam to raster over the sample surface while detecting secondary electrons, backscatter electrons, and X-rays.

The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface typography, composition, and other properties such as electrical conductivity. 

Scanning Electron Microscope

A typical SEM contrast is based on a difference in secondary electron yield or topographical features.

A Scanning Electron Microscope is very useful for particle analysis, contamination ID, determining the thickness of thin films, investigating delamination, and element composition.

As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:


Years of Experience


State-of-the-Art Instruments


Clients Worldwide


Global Locations

Ask an Expert

Please submit your scanning electron microscope inquiry online, and we’ll route it to the right technical expert. We reply to most online inquiries within two hours if received between 6 AM and 5 PM Pacific Standard Time.

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