Scanning Electron Microscope
Eurofins Nanolab Technologies offers its customers Scanning Electron Microscope (SEM) services. Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.
A Scanning Electron Microscope (SEM) is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern.
The technique uses an e-beam to raster over the sample surface while detecting secondary electrons, backscatter electrons, and X-rays. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface typography, composition, and other properties such as electrical conductivity. A typical SEM contrast is based on a difference in secondary electron yield or topographical features.
A Scanning Electron Microscope is very useful for particle analysis, contamination ID, determining the thickness of thin films, investigating delamination, and element composition.
Learn how SEM combined with EDS is routinely used for semi-quantitative elemental analysis of a wide range of materials.
As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:
40+
Years of Experience
+2,500
State-of-the-Art Instruments
+4,000
Clients Worldwide
+20
Global Locations
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