Scanning Electron Microscope
Eurofins Nanolab Technologies offers its customers Scanning Electron Microscope (SEM) services. Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.
A Scanning Electron Microscope (SEM) is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern.
The technique uses an e-beam to raster over the sample surface while detecting secondary electrons, backscatter electrons, and X-rays.
The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface typography, composition, and other properties such as electrical conductivity.
A typical SEM contrast is based on a difference in secondary electron yield or topographical features.
A Scanning Electron Microscope is very useful for particle analysis, contamination ID, determining the thickness of thin films, investigating delamination, and element composition.
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As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:
40+
Years of Experience
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State-of-the-Art Instruments
+4,000
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