Transmission Electron Microscopy & STEM
Eurofins Nanolab Technologies offers its customers Transmission Electron Microscopy & STEM services. Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.
TEM and STEM are high spatial resolution electron microscopy techniques whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it passes through.
An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera.
The technique is very useful for metrology at resolutions of less than 0.2nm, determination of crystallographic phases, and III-V super lattice characterization.
Learn how PED can be used for crystal grain orientation mapping and strain mapping in devices such as 7nm EUV technology.
As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:
40+
Years of Experience
+2,500
State-of-the-Art Instruments
+4,000
Clients Worldwide
+20
Global Locations
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