Thick Film Characterization is a common application at Nanolab Technologies. Thick film characterizations require either cross-sectioning with chemical analysis or ion beam milling systems that are >10X faster than those used for thin film characterization because the final depth of analysis can be many microns deep into the sample.
Films Analyzed
Sample Types
- Metal coatings
- Protective coatings
- Mirror films
- Others
Analyses Provided
- Depth profiling, line profiling and XY mapping
- Elemental analysis
Analytical Techniques Used
- Glow discharge – mass spectroscopy (GD-MS)
- SEM-EDS
- TEM-EDS cross-sectioning
- X-ray fluorescence (XRF)
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