Analytical Instruments
To Solve Problems
| STEM | FT-IR | AR-XPS | HAADF | XRR | EELS |
| FIB-SEM | 2D X-ray | Circuit-Edit | C-SAM | SOM | LA ICP-MS |
| XPS | EF-TEM | XRD | SIMS | TEM | TDR |
| 300mm XPS | UHR-SEM | 3D X-ray | Raman | EDS | More… |
How Nanolab solves materials problems, process problems and product problems…
- We analyze the chemical and physical structures of:
Defects, Materials, Wafers, Polymers, Thin Films, Thick Films, Semiconductors, Ceramics, Glasses, Powders, Alloys, Complete Unknowns …
- We perform electrical failure analysis, circuit-editing, design debug, non-destructive imaging…
- We use surface chemical analysis, structure analysis, chemical analysis, spectroscopy, advanced electron microscopy…
- We use X-ray beams, electron beams, metal ion beams, Ar+ ion beams, NIR laser beams…
- We measure film thickness, chemistry uniformity, critical dimensions, locate defects…
