Analytical services For REAL World Problems

WE KNOW HOW to solve your scientific problems!

Welcome to Eurofins Nanolab Technologies

Eurofins Nanolab Technologies offers customers the finest knowledge based analytical solutions available today. A team of highly skilled and experienced scientists, engineers, and analysts offer both the expertise and technology to provide solutions for Analytical Microscopy, Surface Analysis and Failure Analysis. Partner with Nanolab Technologies today to let us help you face the ever increasing challenges that you may face with today’s shrinking geometries.

Our Services

Imaging techniques such as SEM, TEM, or dual beam SEM

Chemical mapping to characterize a material

Inspecting unexpected  contamination

Determining the reaction of a part with its environment

Analyzing data to determine the cause of a failure

Chemical and physical Imaging type information

Analyzing the surface of a material 

We can bring new perspectives to challenging projects

As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers over 40 years experience in materials testing services.  With 2,500 instruments worldwide we can scale to your demand, meet time constraints and ensure client confidentiality.

Featured Techniques

APT

3D spatial imaging and chemical composition 

Performing TEM analysis at cryogenic temperatures.

Combining a SEM and FIB in one system

Located in Silicon Valley, Eurofins Nanolab Technologies is well positioned to serve customers across a wide range of industries including Semi-equipment and Materials, Automobile, Batteries, Data Storage, LED, Consumables, Bioscience and Academia.

Nanolab Technologies building

Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.

Careers

Unlock Your
Potential
At Nanolab

Technical Webinars

Learn how APT can obtain chemical distributions across grain boundaries, heterojunctions, and thin films.

Learn how analysis of Li-ion batteries materials are critical to understand their performance.

Learn about FIB-SEM methods for cross-section imaging failure analysis and TEM sample preparation.

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