Cryogenic Focused Ion Beam

Eurofins Nanolab Technologies offers its customers Cryogenic Focused Ion Beam (Cryo-FIB) services.  Whether you are seeking to speed time-to-market, solve manufacturing problems or ensure regulatory compliance turn to Eurofins. We know how to bring the power of science to every phase of your product lifecycle.

Cryogenic Focused Ion Beam (Cryo-FIB) uses traditional FIB techniques, but with a sample stage that can be controlled to -135°C.

A focused ion beam which physically bombards the sample and this generates a lot of heat during the milling. This heat can cause damage to sensitive materials. We can solve this problem using smaller current and beam accelerating voltage, but this can dramatically increase the milling time.

With the use of Cryo stage, we can still use a large beam current and voltage to make cross sections with minimal damage. This makes the technique very useful for checking soft materials such as Carbon, Lithium and polymer fibers.

Learn about FIB-SEM methods for cross-section imaging failure analysis and TEM sample preparation.

As part of the EAG Laboratory network, Eurofins Nanolab Technologies offers:


Years of Experience


State-of-the-Art Instruments


Clients Worldwide


Global Locations

Ask an Expert

Please submit your cryogenic focused ion beam inquiry online, and we’ll route it to the right technical expert. We reply to most online inquiries within two hours if received between 6 AM and 5 PM Pacific Standard Time.

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